Volume 36

Veröffentlicht 1992
von Robert K. Willardson bei Elsevier Science
ISBN: 978-0-08-086433-4

Luvina 100

Veröffentlicht 2021
von Amos Oz, Lídia Jorge, Ray Bradbury, Angélica Gorodischer, Eduardo Antonio Parra, Autar Krishen Rahbar, Hélia Correia, Claudia Apablaza, David Miklos, Yoon Sung-Hee, A. B. Yehoshua, Lutz Seiler, Hugo Chaparro Valderrama, Susan Straight, Amar Mitra, Baltasar Porcel, Ana María Shua, Aharon Appelfeld, Kim Keun, John le Carré, Soledad Puértolas, Fernando Ampuero, Carmen Boullosa, Paul Zachari, Antonio Tabucchi, Aimee Bender, Alberto Fuguet, Claudia Salazar Jiménez, Fabio Morábito, Michael Jaime Becerra, Ann Heon Mi, Devibharathi, Juan Manuel de Prada, John Mcgahern, Monika Maron, Alberto Garlini, Carmen Ollé, Juan Manuel Roca, Luis Panini, Shukti Roy, Mariella Mehr, Alessandro Baricco, Liam O'Flaherty, J. A. González Sainz, Nora Bossong, José Luis Peixoto, David L. Ulin, Ignacio Padilla, Diamela Eltit, Edgardo Rivera Martínez, Octavio Escobar Giraldo, Fernanda García Loa, Juan Ramírez Biedermann, Pyun Hye-Young, Felipe Benítez Reyes, Dacia Maraini, Hipólito G. Navarro, Rinny Gremaud, Patricia Reis, Philip Hoare, Sascha Reh, Alonso Cueto, Ricardo Silva Romero, Nicolás González Marzzucco, Alejandra Costamagna, Ben Ehrenreich, José Manuel Torres Funes, Enrique Serna, Chandrakanta Mura Singh, Gila Almagor, Dino Buzzati, Gonzalo Calcedo Juanes, Ingo Schulze, Tessa Hadley, Carola Aikin, Dulce María Cardoso, Leo Felipe Campos, Alberto Laiseca, José Gai, Héctor Abad Faciolince, Joya Mitra, Paola Lagazzi, Juan Pedro Aparicio, Ulrich Peltzer, José María Merino, A. M. Pires Cabral, Amrita Nilanjana, Orly Castel-Bloom, Peter Stamm, Isabel Río Novo, Miguel Bayón, Ned Beauman, Pilar Salamanca, Etgar Keret, Valeria Correa Fiz, David Machado, Louise Welsh, Antonio Skármeta, Roberto Carlos Pérez, César Aira bei Editorial Universidad de Guadalajara
ISBN: 978-607-571-268-0

2009

Veröffentlicht 2009
von David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula bei Springer, Berlin
ISBN: 978-0-7354-0712-1

2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Veröffentlicht 2007
von David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula bei Springer, Berlin
ISBN: 978-0-7354-0441-0

2003 International Conference on Characterization and Metrology for ULSI Technology

Veröffentlicht 2003
von David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Eric M. Secula bei Springer, Berlin
ISBN: 978-0-7354-0152-5